DocumentCode
409166
Title
Lifetime reduction due to insertion devices at BESSY II
Author
Feikes, J. ; Wustefeld, G.
Author_Institution
BESSY, Berlin, Germany
Volume
2
fYear
2003
fDate
12-16 May 2003
Firstpage
845
Abstract
After closing insertion devices at BESSY II to smallest gaps beside appearance of a vertical tune-shift due to the natural focusing of the IDs, it is observed that beam lifetime is considerably reduced, up to 30 %. The reduction neither depends on machine tune nor on the settings of the four BESSY II harmonic sextupole circuits. Here measurements and analytical results to explain and cure this effect are presented.
Keywords
beam handling techniques; electron accelerators; particle beam diagnostics; particle beam stability; storage rings; BESSY II; BESSY II harmonic sextupole circuits; beam lifetime; insertion devices; lifetime reduction; vertical tune-shift; Frequency; Intrusion detection; Light sources; Monitoring; Optical distortion; Optical losses; Optical sensors; Resonance; Tuned circuits; Undulators;
fLanguage
English
Publisher
ieee
Conference_Titel
Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the
ISSN
1063-3928
Print_ISBN
0-7803-7738-9
Type
conf
DOI
10.1109/PAC.2003.1289497
Filename
1289497
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