Title : 
A critical analysis of IGBT geometries, with the intention of mitigating undesirable destruction caused by fault scenarios of an adverse nature
         
        
        
            Author_Institution : 
SLAC, Menlo Park, CA, USA
         
        
        
        
        
        
            Abstract : 
Megawatt class Insulated Gate Bipolar Transistors [IGBTs] find many uses in industrial applications such as traction drives, induction heating and power factor correction. At present, these devices are not optimized for higher speed pulsed-power applications, such as kicker magnets or klystron modulators. This paper identifies fundamental issues that limit the dI/dt performance of standard commercial packages, and investigates several IGBT design optimizations that significantly improve high-speed performance at high peak power levels. The paper presents design concepts, results of electromagnetic simulations, and performance data of actual prototypes under high dI/dt conditions.
         
        
            Keywords : 
insulated gate bipolar transistors; pulsed power supplies; IGBT design optimizations; IGBT geometries; electromagnetic simulations; fault scenarios; industrial applications; megawatt class insulated gate bipolar transistors; standard commercial packages; Design optimization; Geometry; Insulated gate bipolar transistors; Klystrons; Magnetic modulators; Magnets; Packaging; Power factor correction; Pulse modulation; Virtual prototyping;
         
        
        
        
            Conference_Titel : 
Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the
         
        
        
            Print_ISBN : 
0-7803-7738-9
         
        
        
            DOI : 
10.1109/PAC.2003.1289643