DocumentCode :
409267
Title :
A critical analysis of IGBT geometries, with the intention of mitigating undesirable destruction caused by fault scenarios of an adverse nature
Author :
Leyh, G.E.
Author_Institution :
SLAC, Menlo Park, CA, USA
Volume :
2
fYear :
2003
fDate :
12-16 May 2003
Firstpage :
1174
Abstract :
Megawatt class Insulated Gate Bipolar Transistors [IGBTs] find many uses in industrial applications such as traction drives, induction heating and power factor correction. At present, these devices are not optimized for higher speed pulsed-power applications, such as kicker magnets or klystron modulators. This paper identifies fundamental issues that limit the dI/dt performance of standard commercial packages, and investigates several IGBT design optimizations that significantly improve high-speed performance at high peak power levels. The paper presents design concepts, results of electromagnetic simulations, and performance data of actual prototypes under high dI/dt conditions.
Keywords :
insulated gate bipolar transistors; pulsed power supplies; IGBT design optimizations; IGBT geometries; electromagnetic simulations; fault scenarios; industrial applications; megawatt class insulated gate bipolar transistors; standard commercial packages; Design optimization; Geometry; Insulated gate bipolar transistors; Klystrons; Magnetic modulators; Magnets; Packaging; Power factor correction; Pulse modulation; Virtual prototyping;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Particle Accelerator Conference, 2003. PAC 2003. Proceedings of the
ISSN :
1063-3928
Print_ISBN :
0-7803-7738-9
Type :
conf
DOI :
10.1109/PAC.2003.1289643
Filename :
1289643
Link To Document :
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