DocumentCode :
409512
Title :
Single-walled carbon nanotube probes for AFM imaging
Author :
Zhang, Lian ; Ata, Erhan ; Minne, Stephen C. ; Hough, Paul
Author_Institution :
Molecular Nanosyst., USA
fYear :
2004
fDate :
2004
Firstpage :
438
Lastpage :
441
Abstract :
This paper discusses fabrication and characterization of single-walled carbon nanotube (SWNT) AFM probes. By selectively deposit catalytic nanoparticles onto commercial AFM probes with silicon tips, we are able to grow SWNTs on the wafer scale, with 30-50% usable probe yield. We also studied shortening of carbon nanotubes to achieve proper mechanical strength required for AFM application. Comparison shows that SWNT probes consistently reveal 50-100% more surface features than silicon probes. These probes are also successfully used in DNA imaging in a liquid solution.
Keywords :
DNA; atomic force microscopy; biomedical imaging; carbon nanotubes; chemical vapour deposition; mechanical strength; molecular biophysics; nanoparticles; nanotechnology; probes; surface roughness; C; DNA imaging; atomic force microscopy probes; chemical vapour deposition; deoxyribonucleic acid; liquid solution; mechanical strength; nanotechnology; silicon tips; single walled carbon nanotubes; surface roughness; wafer scale production; Atomic force microscopy; Carbon nanotubes; Chemical vapor deposition; DNA; Fabrication; Force feedback; Image resolution; Nanoparticles; Probes; Silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Micro Electro Mechanical Systems, 2004. 17th IEEE International Conference on. (MEMS)
Print_ISBN :
0-7803-8265-X
Type :
conf
DOI :
10.1109/MEMS.2004.1290616
Filename :
1290616
Link To Document :
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