Title :
Piezoelectric materials Pb(In12 /Nb12 /)O3-Pb(Mg13/Nb23/)O3 -PbTiO3 with high Curie temperatures and large piezoelectric constants
Author :
Hosono, Y. ; Yamashita, Y. ; Ichinose, N.
Author_Institution :
Power Supply Mater. & Devices Lab., Toshiba Corp., Kawasaki, Japan
Abstract :
Piezoelectric ceramics and single crystals of xPb(In12 /Nb12 /)O3-yPb(Mg13/Nb23/)O3-zPbTiO3 (PIMNT100x/100y/100z) ternary systems have been investigated in order to develop a new piezoelectric material with high Curie temperature, Tc. Firstly, large coupling factor, kp=67%, piezoelectric constant, d33=510 pC/N, and relatively high Tc=197°C of PIMNT 16/51/33 ceramic were confirmed. Secondly, PIMNT single crystals were grown by the flux method and the solution Bridgman method using a PbO-B2O3 flux and their electrical properties were confirmed. The selected composition was PIMNT 16/51/33. The obtained crystals had excellent electrical properties in the [001] plane: the dielectric constant ε33T /ε0=4000, piezoelectric constant d33=2200 pC/N, coupling factor k33´=80%, which are almost the same as those of the PZNT 91/9 and PMNT 68/32 single crystals. Moreover, they had a large coercive field, Ec=7.0 kV/cm, due to the high Tc=187°C, which is about 1.5 times greater than that of the PMNT 68/32 single crystal and a high frequency constant, N33´r=1160 Hzm, which is 1.4 times higher than that of the PZNT 91/9 single crystal. In view of their large coercive field and high frequency constant, single crystals of PIMNT 16/51/33 are a candidate piezoelectric material with a wide application field.
Keywords :
ferroelectric Curie temperature; lead compounds; permittivity; piezoceramics; piezoelectricity; Bridgman method; Curie temperature; Pb(InNb)O3-Pb(MgNb)O3 -PbTiO3; coercive field; coupling factor; dielectric constant; electrical properties; flux method; piezoelectric ceramics; piezoelectric constant; piezoelectric constants; piezoelectric materials; ternary systems; Ceramics; Chemicals; Crystalline materials; Crystals; Dielectrics; Frequency; Niobium; Piezoelectric devices; Piezoelectric materials; Temperature;
Conference_Titel :
Ultrasonics, 2003 IEEE Symposium on
Print_ISBN :
0-7803-7922-5
DOI :
10.1109/ULTSYM.2003.1293514