DocumentCode :
410264
Title :
New approaches to defect characterisation with high resolution non-contacting laser ultrasound
Author :
Sharples, S. ; Clark, M. ; Somekh, M.G.
Author_Institution :
Sch. of Electr. & Electron. Eng., Nottingham Univ., UK
Volume :
1
fYear :
2003
fDate :
5-8 Oct. 2003
Firstpage :
786
Abstract :
This paper discusses how laser ultrasonic imaging technology may be used for defect detection. The poor single to noise ratio and the consequent potential for damage to the sample have hindered the widespread application of laser ultrasound. We discuss how our approach overcomes many of these problems. Moreover, we discuss the specific and potentially important advantages that arise from the frequency flexibility, absence of couplant and the ability to control the generated wavefront.
Keywords :
acoustic microscopy; crack detection; indentation; laser beam effects; optical microscopy; silicon compounds; ultrasonic imaging; ultrasonic materials testing; SiC; defect characterisation; defect detection; high resolution noncontacting laser ultrasound; laser ultrasonic imaging; Acoustic noise; Focusing; Frequency; Laser noise; Nonlinear optics; Optical noise; Optical surface waves; Signal generators; Ultrasonic imaging; Ultrasonic transducers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Ultrasonics, 2003 IEEE Symposium on
Print_ISBN :
0-7803-7922-5
Type :
conf
DOI :
10.1109/ULTSYM.2003.1293518
Filename :
1293518
Link To Document :
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