Title :
Electromagnetic scattering from rough surfaces with the first- and second-order Kirchhoff approximation in high-frequency limit
Author :
Bourlier, C. ; Déchamps, N. ; Berginc, G.
Author_Institution :
CNRS, Ecole polytechnique de l´´universite de Nantes, France
Abstract :
The incoherent scattering coefficient based on the first- and second-order Kirchhoff approximation is calculated, where the second-order illuminated function derived from recent works is taken into account. To reduce the number of numerical integrations, the geometric optics approximation is used. For a Gaussian process, the model is then compared with exact numerical method, measurements and Ishimaru´s model.
Keywords :
Gaussian processes; electromagnetic wave scattering; remote sensing; topography (Earth); EFIE; Gaussian process; Ishimaru model; electromagnetic field integral equation; electromagnetic scattering; first-order Kirchhoff approximation; geometric optics approximation; incoherent scattering coefficient; method of moments; numerical integrations; rough surfaces; second-order Kirchhoff approximation; second-order illuminated function; Backscatter; Electromagnetic scattering; Gaussian processes; Geometrical optics; Kirchhoff´s Law; Optical scattering; Optical surface waves; Rough surfaces; Shadow mapping; Surface roughness;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2003. IGARSS '03. Proceedings. 2003 IEEE International
Print_ISBN :
0-7803-7929-2
DOI :
10.1109/IGARSS.2003.1293696
