Title :
The dependence of polarimetric coherence on surface roughness for very rough surfaces
Author :
Malhotra, Saurabh ; Kasilingam, Dayalan ; Schuler, Dale
Author_Institution :
University of Massachusetts
Keywords :
Backscatter; Coherence; Dielectric measurements; Frequency; Geophysical measurements; Laboratories; Polarization; Radar scattering; Rough surfaces; Surface roughness;
Conference_Titel :
Geoscience and Remote Sensing Symposium, 2003. IGARSS '03. Proceedings. 2003 IEEE International
Print_ISBN :
0-7803-7929-2
DOI :
10.1109/IGARSS.2003.1294207
