Title :
Micrometer resolution with (sub)-millimeter waves
Author :
van der Valk, N.C.J. ; Planken, P. C M
Author_Institution :
Delft Univ. of Technol., Netherlands
Abstract :
We describe a new terahertz imaging method in which we generate and detect THz spot sizes as small as 10 /spl mu/m in the near field of a metal tip. Theoretically, our method allows for a resolution <100 nm.
Keywords :
electro-optical effects; image resolution; submillimetre wave imaging; micrometer resolution; sub-millimeter waves; terahertz imaging; Distortion measurement; Frequency; Image resolution; Laser beams; Optical distortion; Optical imaging; Optical microscopy; Polarization; Probes; Submillimeter wave technology;
Conference_Titel :
Lasers and Electro-Optics, 2003. CLEO '03. Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-748-2
