Title : 
Sub-wavelength resolution using apertureless terahertz near-field microscopy
         
        
            Author : 
Wang, Kanglin ; Barkan, Adrian ; Mittleman, Daniel M.
         
        
            Author_Institution : 
Dept. of Electr. & Comput. Eng., Rice Univ., Houston, TX, USA
         
        
        
        
            Abstract : 
We demonstrate apertureless near-field terahertz imaging by introducing a metallic probe above a sample surface. The amplitude of the scattered pulses is very sensitive to the tip-sample distance. A spatial resolution of /spl lambda//520 is demonstrated.
         
        
            Keywords : 
image resolution; near-field scanning optical microscopy; submillimetre wave imaging; apertureless terahertz near-field microscopy; metallic probe; pulse scattering; sub-wavelength resolution; terahertz imaging; Optical imaging; Optical microscopy; Optical receivers; Optical scattering; Optical sensors; Optical surface waves; Probes; Surface topography; Surface waves; Ultrafast optics;
         
        
        
        
            Conference_Titel : 
Lasers and Electro-Optics, 2003. CLEO '03. Conference on
         
        
            Conference_Location : 
Baltimore, MD, USA
         
        
            Print_ISBN : 
1-55752-748-2