DocumentCode
411768
Title
Soft x-ray pulse duration measurement with sub-100-fs resolution using ultrafast resonance absorption change caused by optical-field-induced ionization
Author
Oguri, Katsuya ; Ozaki, Tsuneyuki ; Nishikawa, Tadashi ; Nakano, Hidetoshi
Author_Institution
NTT Basic Research Laboratories, NTT Corporation
fYear
2003
fDate
6-6 June 2003
Firstpage
378
Lastpage
380
Keywords
Electromagnetic wave absorption; Gas lasers; Ionization; Optical pulse generation; Optical pulses; Plasma measurements; Pulse measurements; Resonance; Ultrafast optics; X-ray lasers;
fLanguage
English
Publisher
ieee
Conference_Titel
Lasers and Electro-Optics, 2003. CLEO '03. Conference on
Conference_Location
Baltimore, MD, USA
Print_ISBN
1-55752-748-2
Type
conf
Filename
1297852
Link To Document