DocumentCode :
411768
Title :
Soft x-ray pulse duration measurement with sub-100-fs resolution using ultrafast resonance absorption change caused by optical-field-induced ionization
Author :
Oguri, Katsuya ; Ozaki, Tsuneyuki ; Nishikawa, Tadashi ; Nakano, Hidetoshi
Author_Institution :
NTT Basic Research Laboratories, NTT Corporation
fYear :
2003
fDate :
6-6 June 2003
Firstpage :
378
Lastpage :
380
Keywords :
Electromagnetic wave absorption; Gas lasers; Ionization; Optical pulse generation; Optical pulses; Plasma measurements; Pulse measurements; Resonance; Ultrafast optics; X-ray lasers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics, 2003. CLEO '03. Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-748-2
Type :
conf
Filename :
1297852
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=411768
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