Title :
Mapping of Cr ion profile in Cr:YAG crystal fiber by confocal microscopy
Author :
Chen, J.C. ; Lo, C.Y. ; Huang, S.L.
Author_Institution :
Inst. of Electro-Opt. Eng., Nat. Sun Yat-Sen Univ., Kaohsiung, Taiwan
Abstract :
We have demonstrated the use of confocal fluorescent microscopy in mapping the Cr/sup +3/ profile within the YAG crystal fiber. A sensitivity of 1.0/spl times/10/sup 17//cm/sup 3/ was achieved, which is more than an order of magnitude better than that of electron probe microanalysis.
Keywords :
chromium; fluorescence; infrared spectra; optical fibres; optical materials; optical microscopy; yttrium compounds; Cr ion profile; Cr:YAG crystal fiber; YAG:Cr; YAl5O12:Cr; confocal fluorescent microscopy; Biomedical optical imaging; Chromium; Electrons; Fiber nonlinear optics; Fluorescence; Frequency conversion; Microscopy; Optical fiber communication; Optical fiber devices; Probes;
Conference_Titel :
Lasers and Electro-Optics, 2003. CLEO '03. Conference on
Conference_Location :
Baltimore, MD, USA
Print_ISBN :
1-55752-748-2
