412356

Measurement of the index of refraction of a flat zinc germanium phosphide wafer in the infrared

Gillen, Glen D. ; Guha, Shekhar

Anteon Corporation

2003

6-6 June 2003

1777

1778

Force measurement; Germanium; Laboratories; Nonlinear optics; Optical interferometry; Optical materials; Optical refraction; Optical variables control; Refractive index; Zinc;

English

ieee

Lasers and Electro-Optics, 2003. CLEO '03. Conference on

Baltimore, MD, USA

1-55752-748-2

conf

1298507