• DocumentCode
    412356
  • Title

    Measurement of the index of refraction of a flat zinc germanium phosphide wafer in the infrared

  • Author

    Gillen, Glen D. ; Guha, Shekhar

  • Author_Institution
    Anteon Corporation
  • fYear
    2003
  • fDate
    6-6 June 2003
  • Firstpage
    1777
  • Lastpage
    1778
  • Keywords
    Force measurement; Germanium; Laboratories; Nonlinear optics; Optical interferometry; Optical materials; Optical refraction; Optical variables control; Refractive index; Zinc;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics, 2003. CLEO '03. Conference on
  • Conference_Location
    Baltimore, MD, USA
  • Print_ISBN
    1-55752-748-2
  • Type

    conf

  • Filename
    1298507
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=412356