DocumentCode :
41252
Title :
A New Method for EEG-Based Concealed Information Test
Author :
Deng Wang ; Duoqian Miao ; Blohm, G.
Author_Institution :
Dept. of Comput. Sci. & Technol., Tongji Univ., Shanghai, China
Volume :
8
Issue :
3
fYear :
2013
fDate :
Mar-13
Firstpage :
520
Lastpage :
527
Abstract :
Forensic electroencephalogram (EEG)-based lie detection has recently begun using the concealed information test (CIT) as a potentially more robust alternative to the classical comparative questions test. The main problem with using CIT is that it requires an objective and fast decision algorithm under the constraint of limited available information. In this study, we developed a simple and feasible hierarchical knowledge base construction and test method for efficient concealed information detection based on objective EEG measures. We describe how a hierarchical feature space was formed and which level of the feature space was sufficient to accurately predict concealed information from the raw EEG signal in a short time. A total of 11 subjects went through an autobiographical paradigm test. A high accuracy of 95.23% in recognizing concealed information with a single EEG electrode within about 20 seconds demonstrates effectiveness of the method.
Keywords :
electrodes; electroencephalography; medical signal processing; EEG electrode; EEG-based concealed information test; EEG-based lie detection; autobiographical paradigm test; classical comparative questions test; concealed information detection; fast decision algorithm; forensic electroencephalogram; hierarchical feature space; hierarchical knowledge base construction; objective EEG measures; raw EEG signal; Accuracy; Classification algorithms; Educational institutions; Electrodes; Electroencephalography; Feature extraction; Knowledge based systems; EEG classification; Electroencephalogram (EEG); concealed information test (CIT); feature extraction; hierarchical knowledge base;
fLanguage :
English
Journal_Title :
Information Forensics and Security, IEEE Transactions on
Publisher :
ieee
ISSN :
1556-6013
Type :
jour
DOI :
10.1109/TIFS.2013.2244884
Filename :
6428682
Link To Document :
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