DocumentCode
412908
Title
Continuous time analog filter test using signature analysis
Author
Ai-Qutayri, M.A.
Author_Institution
Emirates Telecommun. Corp, Etisalat Coll. of Eng., Sharjah, United Arab Emirates
Volume
2
fYear
2003
fDate
14-17 Dec. 2003
Firstpage
603
Abstract
This paper discusses the importance and difficulties associated with testing analog circuits in general and those residing within mixed-signal circuits in particular. It proposes a tested method that is not oriented towards specification testing. The method is based on the excitation of the circuit-under-test with a pseudo random binary sequence and the subsequent analysis of the captured response. The fault detection capabilities of the test and data analysis methods are demonstrated by applying them to a continuous time filter circuit operating in the midband frequency range. The study analyses the confidence in the detection with respect to the analysis method applied and circuit node being accessed.
Keywords
analogue integrated circuits; binary sequences; continuous time filters; fault simulation; integrated circuit testing; random sequences; transient response; analog circuits testing; captured circuit response; catastrophic fault conditions; circuit-under-test excitation; continuous time analog filter; fault coverage; fault detection; fault models; mixed-signal circuits; pseudorandom binary sequence; second-order state variable filter circuit; signature analysis; soft fault conditions; Analog circuits; Binary sequences; Circuit faults; Circuit testing; Design for testability; Educational institutions; Electrical fault detection; Filters; Integrated circuit modeling; Manufacturing processes;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronics, Circuits and Systems, 2003. ICECS 2003. Proceedings of the 2003 10th IEEE International Conference on
Print_ISBN
0-7803-8163-7
Type
conf
DOI
10.1109/ICECS.2003.1301857
Filename
1301857
Link To Document