Title :
Predicting voltage stress effects on MV/LV components
Author :
Gallo, Daniele ; Langella, Roberto ; Testa, Alfredo
Author_Institution :
Dipt. di Ingegncria dell´´lnformazione, Seconda Universita di Napoli, Aversa, Italy
Abstract :
The problem of predicting voltage stress effects on MV/LV components is discussed. Reference is made to the measurement techniques of the voltage peak, which is the main cause of aging of solid type insulation, in terms of input data, aggregation intervals, observation period and statistical treatment. A new electrical stress statistical index is introduced. On-field measurements are analyzed with reference to different component duty-cycles.
Keywords :
ageing; electric field measurement; insulation; life testing; statistical analysis; voltage measurement; LV component; MV component; aggregation interval; aging; component expected life; duty-cycle; electrical stress; on-field measurement; solid type insulation; statistical index; statistical treatment; voltage peak measurement; voltage stress effect; Aging; Dielectrics and electrical insulation; Measurement techniques; Solids; Temperature; Testing; Thermal degradation; Thermal factors; Thermal stresses; Voltage;
Conference_Titel :
Power Tech Conference Proceedings, 2003 IEEE Bologna
Print_ISBN :
0-7803-7967-5
DOI :
10.1109/PTC.2003.1304298
