DocumentCode
413157
Title
Predicting voltage stress effects on MV/LV components
Author
Gallo, Daniele ; Langella, Roberto ; Testa, Alfredo
Author_Institution
Dipt. di Ingegncria dell´´lnformazione, Seconda Universita di Napoli, Aversa, Italy
Volume
2
fYear
2003
fDate
23-26 June 2003
Abstract
The problem of predicting voltage stress effects on MV/LV components is discussed. Reference is made to the measurement techniques of the voltage peak, which is the main cause of aging of solid type insulation, in terms of input data, aggregation intervals, observation period and statistical treatment. A new electrical stress statistical index is introduced. On-field measurements are analyzed with reference to different component duty-cycles.
Keywords
ageing; electric field measurement; insulation; life testing; statistical analysis; voltage measurement; LV component; MV component; aggregation interval; aging; component expected life; duty-cycle; electrical stress; on-field measurement; solid type insulation; statistical index; statistical treatment; voltage peak measurement; voltage stress effect; Aging; Dielectrics and electrical insulation; Measurement techniques; Solids; Temperature; Testing; Thermal degradation; Thermal factors; Thermal stresses; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Tech Conference Proceedings, 2003 IEEE Bologna
Print_ISBN
0-7803-7967-5
Type
conf
DOI
10.1109/PTC.2003.1304298
Filename
1304298
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