DocumentCode
413431
Title
Light emission from Si/SiO/sub 2/ nanostructures
Author
Sinkkonen, Juha ; Novikov, Sergei ; Ovchinnikov, Victor ; Toivola, Tero
Author_Institution
Lab. of Electron Phys., Helsinki Univ. of Technol., Espoo, Finland
Volume
3
fYear
2003
fDate
18-18 May 2003
Firstpage
2676
Abstract
Various kinds of nanostructures are made utilizing molecular beam deposition, ion implantation, and PECVD accompanied by different annealing procedures. MOS-type light emitting devices are made and their luminescent as well as electrical properties are studied. Emission spectrum extends from red to blue depending on fabrication conditions. The red part is associated with silicon nano-clusters. It can be understood by quantum confinement model taking into account surface chemistry of clusters. The same model may also explain the blue part the alternative being emission from defects in oxide. Current conduction is shown to take place by inelastic tunneling of electrons between clusters. The inelastic process also provides EL excitation mechanism leading to a linear relationship between emission intensity and current.
Keywords
annealing; electrical conductivity; electroluminescence; elemental semiconductors; ion implantation; light emitting diodes; luminescent devices; nanostructured materials; photoluminescence; silicon; silicon compounds; tunnelling; vapour deposited coatings; EL excitation mechanism; MOS type light emitting device; PECVD; Si-SiO/sub 2/; annealing; defects; electrical properties; emission intensity; emission spectrum; inelastic tunneling; ion implantation; light emission; luminescent; molecular beam deposition; nanostructures; quantum confinement model; silicon nanocluster; surface chemistry;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
Conference_Location
Osaka, Japan
Print_ISBN
4-9901816-0-3
Type
conf
Filename
1305142
Link To Document