DocumentCode
41355
Title
Total Dose Effects: A New Approach to Assess the Impact of Radiation on Device Reliability
Author
Martinez, N. ; Gilard, O. ; Quadri, G.
Author_Institution
Univ. Montpellier II, Montpellier, France
Volume
60
Issue
3
fYear
2013
fDate
Jun-13
Firstpage
2266
Lastpage
2271
Abstract
In this paper, a new Radiation Hardness Assurance methodology applicable to cumulative effects is proposed to assess the impact of radiation on device reliability. This approach, that relies on the stochastic interpolation of experimental data, is based on the notion of Wiener process. An example of application of this methodology is presented and a comparison with a more conventional Radiation Hardness Assurance is discussed.
Keywords
interpolation; radiation hardening (electronics); reliability; stochastic processes; Radiation Hardness Assurance methodology; Wiener process; cumulative effect; device reliability; stochastic interpolation; total dose effect; Degradation; Interpolation; Market research; Mathematical model; Performance evaluation; Phototransistors; Reliability; Radiation Hardness Assurance methodology; Wiener process; reliability estimation; total dose effects;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/TNS.2013.2254128
Filename
6510460
Link To Document