DocumentCode :
41355
Title :
Total Dose Effects: A New Approach to Assess the Impact of Radiation on Device Reliability
Author :
Martinez, N. ; Gilard, O. ; Quadri, G.
Author_Institution :
Univ. Montpellier II, Montpellier, France
Volume :
60
Issue :
3
fYear :
2013
fDate :
Jun-13
Firstpage :
2266
Lastpage :
2271
Abstract :
In this paper, a new Radiation Hardness Assurance methodology applicable to cumulative effects is proposed to assess the impact of radiation on device reliability. This approach, that relies on the stochastic interpolation of experimental data, is based on the notion of Wiener process. An example of application of this methodology is presented and a comparison with a more conventional Radiation Hardness Assurance is discussed.
Keywords :
interpolation; radiation hardening (electronics); reliability; stochastic processes; Radiation Hardness Assurance methodology; Wiener process; cumulative effect; device reliability; stochastic interpolation; total dose effect; Degradation; Interpolation; Market research; Mathematical model; Performance evaluation; Phototransistors; Reliability; Radiation Hardness Assurance methodology; Wiener process; reliability estimation; total dose effects;
fLanguage :
English
Journal_Title :
Nuclear Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9499
Type :
jour
DOI :
10.1109/TNS.2013.2254128
Filename :
6510460
Link To Document :
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