Title :
Total Dose Effects: A New Approach to Assess the Impact of Radiation on Device Reliability
Author :
Martinez, N. ; Gilard, O. ; Quadri, G.
Author_Institution :
Univ. Montpellier II, Montpellier, France
Abstract :
In this paper, a new Radiation Hardness Assurance methodology applicable to cumulative effects is proposed to assess the impact of radiation on device reliability. This approach, that relies on the stochastic interpolation of experimental data, is based on the notion of Wiener process. An example of application of this methodology is presented and a comparison with a more conventional Radiation Hardness Assurance is discussed.
Keywords :
interpolation; radiation hardening (electronics); reliability; stochastic processes; Radiation Hardness Assurance methodology; Wiener process; cumulative effect; device reliability; stochastic interpolation; total dose effect; Degradation; Interpolation; Market research; Mathematical model; Performance evaluation; Phototransistors; Reliability; Radiation Hardness Assurance methodology; Wiener process; reliability estimation; total dose effects;
Journal_Title :
Nuclear Science, IEEE Transactions on
DOI :
10.1109/TNS.2013.2254128
