• DocumentCode
    413602
  • Title

    Degradation study on a commercial copper indium diselenide module

  • Author

    Lam, King-hang ; Close, Josie ; Durisch, Wilhelm

  • Author_Institution
    Dept. of Archit., Hong Kong Univ., China
  • Volume
    1
  • fYear
    2003
  • fDate
    18-18 May 2003
  • Firstpage
    479
  • Abstract
    This paper will illustrate the collaborative research conducted by Paul Scherrer Institute and The University of Hong Kong on the behaviour of a commercially available CIS module under real operating conditions. Tests done under different cell temperature, solar irradiance, and air mass conditions facilitate the development of a semi-empirical efficiency model on a newly purchased CIS module. The tests were repeated after one year´s exposure to sunlight. The system set-up, measuring procedures, and test results are presented. Following detailed analysis of the results, it is suggested that the PV industry broadens disclosure of module parameters in future technical data published.
  • Keywords
    copper compounds; indium compounds; semiconductor device models; semiconductor thin films; solar cells; sunlight; ternary semiconductors; 1 year; CIS module; CuInSe/sub 2/; air mass conditions; cell temperature; degradation; real operating conditions; semi-empirical efficiency model; solar irradiance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
  • Conference_Location
    Osaka, Japan
  • Print_ISBN
    4-9901816-0-3
  • Type

    conf

  • Filename
    1305325