• DocumentCode
    413604
  • Title

    Modelling of polycrystalline thin film solar cells: new features in SCAPS version 2.3

  • Author

    Degrave, Stefaan ; Burgelman, Marc ; Nollet, Peter

  • Author_Institution
    Dept. of Electron. & Information Syst., Ghent Univ., Gent, Belgium
  • Volume
    1
  • fYear
    2003
  • fDate
    18-18 May 2003
  • Firstpage
    487
  • Abstract
    Modern characterisation of thin film solar cells is based on a variety of standard and advanced (opto-) electrical experiments. In the case of complicated structures, like most of the polycrystalline thin film solar cells, interpretation of such experiments is almost impossible without the help of simulation programs. In many cases numerical simulation of a thin film solar cell can lead to better insight into the details of physical operation. It can even give new insights to improve the technology. The numerical simulation tool SCAPS is developed at our lab to deal with polycrystalline thin film solar cells. The program is able to simulate standard experiments like I(V) and QE(/spl lambda/) as well as more advanced measurements like C(V) and C(f). The program is now in a state of extension to transient analysis; it will be able to simulate current and capacitance in function of time. Different methods to solve the time dependent problem and first results and observations of transient behaviour are treated in this article.
  • Keywords
    electronic engineering computing; semiconductor device models; solar cells; thin films; C(V) measurement; C(f ) measurement; I(V) measurement; QE(/spl lambda/) measurement; numerical simulation; polycrystalline thin film solar cell; simulation program;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
  • Conference_Location
    Osaka, Japan
  • Print_ISBN
    4-9901816-0-3
  • Type

    conf

  • Filename
    1305327