• DocumentCode
    413650
  • Title

    Irradiation of Cu(In,Ga)Se/sub 2/ thin film solar cells with 110-, 210-, and 290- keV protons

  • Author

    Weinert, K. ; Schwickert, M. ; Rau, U.

  • Author_Institution
    Inst. of Phys. Electron., Stuttgart Univ., Germany
  • Volume
    1
  • fYear
    2003
  • fDate
    18-18 May 2003
  • Firstpage
    697
  • Abstract
    This study presents irradiation experiments of Cu(In,Ga)Se/sub 2/ thin-film solar cells using protons with energies of 110, 210, and 290 keV, i.e., in an energy range that is expected to cause maximum damage in the Cu(In,Ga)Se/sub 2/ absorber layer. Monte-Carlo simulations predict the average depth of the irradiation induced vacancies as well as the integral number of generated vacancies. From our irradiation experiments, we find critical fluences, that causes an open circuit voltage losses /spl Delta/V/sub OC/ = 50 mV, of 1/spl times/10/sup 12/, 3/spl times/10/sup 11/, and 8/spl times/10/sup 11/ cm/sup -2/ for 110-, 210- and 290-keV protons. Quantum efficiency analysis of irradiated solar cells show collection losses in the whole wavelength range after 110-keV proton bombardments, whereas the losses shift to longer wavelengths with increasing proton energy and penetration depth. Our experiments, thus, indicate a highly localized damage in various depths of the Cu(In,Ga)Se/sub 2/ solar cells as predicted by the simulations.
  • Keywords
    Monte Carlo methods; copper compounds; gallium compounds; indium compounds; proton effects; radiation hardening (electronics); semiconductor process modelling; semiconductor thin films; solar cells; ternary semiconductors; 110 keV; 210 keV; 290 keV; Cu(InGa)Se/sub 2/; Monte-Carlo simulation; absorber layer; open circuit voltage losses; penetration depth; proton energy; proton irradiation; quantum efficiency; thin film solar cell; vacancies;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
  • Conference_Location
    Osaka, Japan
  • Print_ISBN
    4-9901816-0-3
  • Type

    conf

  • Filename
    1305377