DocumentCode :
413654
Title :
Modelling low energy proton radiation effects on solar cells
Author :
Messenger, S.R. ; Burke, E.A. ; Morton, T.L. ; Summers, G.P. ; Walters, R.J. ; Warner, J.H.
Author_Institution :
SFA Inc., Largo, MD, USA
Volume :
1
fYear :
2003
fDate :
18-18 May 2003
Firstpage :
716
Abstract :
Past work has shown that the degradation of gallium arsenide solar cells in space radiation environments can be described with a single curve for a wide range of incident particle energies using the displacement damage dose (D/sub d/) approach. This greatly simplifies the prediction of the performance of GaAs solar cells exposed to complex particle spectra. A similar approach has not been applied to silicon solar cells because the large diffusion length in silicon means that protons of relatively high energy lose a significant fraction of their energy in the active region of the cell. The proton energy is, therefore, not well defined in the device. In this paper we show how the Monte Carlo code SRIM can be used to extend the D/sub d/ approach to cases where this occurs. The analysis will be applied to both single junction Si and GaAs solar cells. Space prediction comparisons will also be made using both the experimentally-derived (JPL) and simulation-derived (SRIM) relative damage coefficients (RDCs) for maximum power (P/sub max/) in Si solar cells.
Keywords :
III-V semiconductors; Monte Carlo methods; elemental semiconductors; gallium arsenide; proton effects; radiation hardening (electronics); semiconductor process modelling; silicon; solar cells; GaAs; Monte Carlo code; SRIM; Si; complex particle spectra; diffusion length; displacement damage dose approach; low energy proton radiation effect; maximum power; relative damage coefficients; solar cell; space prediction; space radiation environment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
Conference_Location :
Osaka, Japan
Print_ISBN :
4-9901816-0-3
Type :
conf
Filename :
1305382
Link To Document :
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