Title :
Two-dimensional modelling of polycrystalline silicon thin film solar cells
Author :
Zerga, A. ; Christoffel, E. ; Slaoui, A.
Author_Institution :
Lab. PHASE, CNRS, Strasbourg, France
Abstract :
In this paper, we present a model for the 2D numerical simulation of polycrystalline silicon solar cells. This model assumes a columnar structure of grain boundaries and a preferential diffusion of dopants formed along grain boundaries during the emitter step process. The simulation results of IQE and I-V parameters are compared to experimental data obtained on n/sup +/pp/sup +/ polycrystalline Si structure, 25 /spl mu/m thick and with 4 /spl mu/m grain size. The theoretical calculations showed a potential of about 10% efficiency with deep emitter diffusion. The limiting parameters like recombination velocity at grain boundaries and phosphorus diffusion depth effects on the I-V characteristic and the internal quantum efficiency are discussed. The effect of the drift-field in the base region on the enhancement of the minority carrier diffusion length is also investigated and discussed.
Keywords :
carrier lifetime; doping profiles; elemental semiconductors; grain boundaries; grain boundary diffusion; grain size; minority carriers; numerical analysis; phosphorus; semiconductor device models; semiconductor doping; semiconductor thin films; silicon; solar cells; 25 micron; 2D numerical simulation; I-V curve; Si:P; columnar structure; deep emitter diffusion; dopants preferential diffusion; drift field effect; emitter step process; grain boundaries; grain size; internal quantum efficiency; minority carrier diffusion length; n/sup +/pp/sup +/ polycrystalline Si structure; phosphorus diffusion depth; polycrystalline silicon thin film solar cells; recombination velocity; two dimensional modelling;
Conference_Titel :
Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
Conference_Location :
Osaka, Japan
Print_ISBN :
4-9901816-0-3