DocumentCode
413936
Title
Long term reliability evaluation of PV module
Author
Tsuda, Izumi ; Igari, Sanekazu ; Nakahara, Kenji ; Takahisa, Kiyoshi ; Morita, Kengo ; Kato, Hiroshi
Author_Institution
Nat. Inst. of Adv. Ind. Sci. & Technol., Japan
Volume
2
fYear
2003
fDate
18-18 May 2003
Firstpage
1960
Abstract
Long-term reliability of photovoltaic (PV) module is important for the reliability of the photovoltaic generating system. Especially, the milky white phenomena and the series resistance increasing of crystalline silicon PV module influence the output of PV module. To establish the method of causing these phenomena accelerating on PV module, the research is executed. This paper describes the outline of testing method of long-term reliability for PV module, and the initial results are explained. Furthermore as the evaluation technology of degradation level, the measurement method of characteristics of each cell in module is explained.
Keywords
elemental semiconductors; modules; nondestructive testing; photovoltaic cells; reliability; silicon; PV module acceleration; Si; crystalline silicon; degradation level; long term reliability evaluation; milky white phenomena; nondestructive testing; photovoltaic generating system; photovoltaic module; reliability testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
Conference_Location
Osaka, Japan
Print_ISBN
4-9901816-0-3
Type
conf
Filename
1306327
Link To Document