DocumentCode :
413936
Title :
Long term reliability evaluation of PV module
Author :
Tsuda, Izumi ; Igari, Sanekazu ; Nakahara, Kenji ; Takahisa, Kiyoshi ; Morita, Kengo ; Kato, Hiroshi
Author_Institution :
Nat. Inst. of Adv. Ind. Sci. & Technol., Japan
Volume :
2
fYear :
2003
fDate :
18-18 May 2003
Firstpage :
1960
Abstract :
Long-term reliability of photovoltaic (PV) module is important for the reliability of the photovoltaic generating system. Especially, the milky white phenomena and the series resistance increasing of crystalline silicon PV module influence the output of PV module. To establish the method of causing these phenomena accelerating on PV module, the research is executed. This paper describes the outline of testing method of long-term reliability for PV module, and the initial results are explained. Furthermore as the evaluation technology of degradation level, the measurement method of characteristics of each cell in module is explained.
Keywords :
elemental semiconductors; modules; nondestructive testing; photovoltaic cells; reliability; silicon; PV module acceleration; Si; crystalline silicon; degradation level; long term reliability evaluation; milky white phenomena; nondestructive testing; photovoltaic generating system; photovoltaic module; reliability testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
Conference_Location :
Osaka, Japan
Print_ISBN :
4-9901816-0-3
Type :
conf
Filename :
1306327
Link To Document :
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