• DocumentCode
    413936
  • Title

    Long term reliability evaluation of PV module

  • Author

    Tsuda, Izumi ; Igari, Sanekazu ; Nakahara, Kenji ; Takahisa, Kiyoshi ; Morita, Kengo ; Kato, Hiroshi

  • Author_Institution
    Nat. Inst. of Adv. Ind. Sci. & Technol., Japan
  • Volume
    2
  • fYear
    2003
  • fDate
    18-18 May 2003
  • Firstpage
    1960
  • Abstract
    Long-term reliability of photovoltaic (PV) module is important for the reliability of the photovoltaic generating system. Especially, the milky white phenomena and the series resistance increasing of crystalline silicon PV module influence the output of PV module. To establish the method of causing these phenomena accelerating on PV module, the research is executed. This paper describes the outline of testing method of long-term reliability for PV module, and the initial results are explained. Furthermore as the evaluation technology of degradation level, the measurement method of characteristics of each cell in module is explained.
  • Keywords
    elemental semiconductors; modules; nondestructive testing; photovoltaic cells; reliability; silicon; PV module acceleration; Si; crystalline silicon; degradation level; long term reliability evaluation; milky white phenomena; nondestructive testing; photovoltaic generating system; photovoltaic module; reliability testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Photovoltaic Energy Conversion, 2003. Proceedings of 3rd World Conference on
  • Conference_Location
    Osaka, Japan
  • Print_ISBN
    4-9901816-0-3
  • Type

    conf

  • Filename
    1306327