DocumentCode :
41397
Title :
New Techniques and Tools for Application-Dependent Testing of FPGA-Based Components
Author :
Cilardo, Alessandro
Author_Institution :
Dept. of Electr. Eng. & Inf. Technol., Univ. of Naples Federico II, Naples, Italy
Volume :
11
Issue :
1
fYear :
2015
fDate :
Feb. 2015
Firstpage :
94
Lastpage :
103
Abstract :
Field programmable gate array (FPGA) devices are increasingly being deployed in industrial environments, making reconfigurable hardware testing and reliability an active area of investigation. While FPGA devices can be tested exhaustively, the so-called application-dependent test (ADT) has emerged as an effective approach ensuring reduced testing efforts and improving the manufacturing yield since it can selectively exclude a subset of faults not affecting a given design. In addition to manufacturing, ADT can be used online, providing a solution for fast runtime fault detection and diagnostics. This paper identifies a number of issues in existing ADT techniques which limit their applicability and proposes new approaches improving the range of covered faults, with special emphasis on feedback bridging faults, as well as new algorithms for generating ADT test configurations. Furthermore, the work introduces a software environment addressing the current lack of tools, either academic or commercial, supporting ADT techniques. The architecture of the environment is highly modular and extensively based on a plug-in approach. To demonstrate the potential of the toolset, we developed a complete suite of plug-ins, based on both state-of-the-art ADT techniques and the novel approaches introduced here. The experimental results presented at the end of the paper confirm the impact of the proposed techniques.
Keywords :
field programmable gate arrays; integrated circuit testing; ADT test configurations; FPGA-based components; application-dependent testing; fast runtime fault detection; fault diagnostics; feedback bridging faults; field programmable gate array devices; industrial environments; plug-in approach; software environment; Circuit faults; Field programmable gate arrays; Logic gates; Table lookup; Testing; Vectors; Wires; Application-dependent testing (ADT); field-programmable gate arrays (FPGAs); testing;
fLanguage :
English
Journal_Title :
Industrial Informatics, IEEE Transactions on
Publisher :
ieee
ISSN :
1551-3203
Type :
jour
DOI :
10.1109/TII.2014.2370532
Filename :
6955816
Link To Document :
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