DocumentCode :
414475
Title :
A new X-factor contribution measure for identifying machine level capacity constraints and variability
Author :
Delp, Deana R.
Author_Institution :
Dept. of Electr. Eng., Arizona State Univ., Tempe, AZ, USA
fYear :
2004
fDate :
4-6 May 2004
Firstpage :
334
Lastpage :
338
Abstract :
Semiconductor manufacturing is a very complex process involving product mix, reentry lot flows, batching, and machine breakdowns all of which contribute to system variability. Reducing variability in a manufacturing process lowers lot cycle times. This study examines the issue of identifying machines that constrain the system and have a major impact on they system´s cycle time. A new X-factor contribution measurement is developed that considers processing time variability and lot arrival variability among the constraining qualities of the machine groups. The effectiveness of this new measure to identify machine groups that significantly impact mean cycle time is tested in several operating scenarios.
Keywords :
batch processing (industrial); capacity planning (manufacturing); integrated circuit manufacture; machinery; manufacturing processes; semiconductor device manufacture; X-factor contribution measurement; batch processing; lot arrival variability; lot cycle time; machine breakdowns; machine groups identification; machine level capacity constraints; manufacturing process; mean cycle time; processing time variability; semiconductor manufacturing; system cycle time; system variability; Equations; Machinery; Manufacturing; Production facilities; Queueing analysis; Testing; Throughput; Time factors; Time measurement; USA Councils;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Advanced Semiconductor Manufacturing, 2004. ASMC '04. IEEE Conference and Workshop
Print_ISBN :
0-7803-8312-5
Type :
conf
DOI :
10.1109/ASMC.2004.1309592
Filename :
1309592
Link To Document :
بازگشت