DocumentCode
41527
Title
Beneficial Effects of
Buffer/Spacer Layers on the Magnetic Properties of Exchange-Coupled PtFe/Fe Composite Films
Author
Cui, W.B. ; Gong, W.J. ; Zhao, X.G. ; Shih, Chih Wei ; Liu, Wenxin ; Zhang, Z.D.
Author_Institution
Int. Centre for Mater. Phys., Inst. of Metal Res., Shenyang, China
Volume
49
Issue
7
fYear
2013
fDate
Jul-13
Firstpage
3656
Lastpage
3659
Abstract
Exchange-coupled PtFe/Fe composite films have been prepared with Si3N4 as spacer layer and buffer layer. The coercivity generally decreases with increasing thickness of the Fe layer at fixed thickness of the Si3N4 spacer layer. At fixed thickness of Fe the layer, the coercivity shows a maximum and then declines with increasing thickness of the Si3N4 spacer layer because Si3N4 layer is too thin to play a role of separation. However, the magnetic properties are significantly enhanced by a Si3N4 buffer layer, which is proposed to be due to effective prevention of diffusion between Mo and PtFe phase, as indicated by microstructure images. Fine grain sizes estimated to be about 30 nm, an enhanced coercivity and better remanence ratio indicate the beneficial effects of Si3N4 buffer layer on the magnetic properties and on the exchange-coupling of PtFe/Fe composite films.
Keywords
buffer layers; chemical interdiffusion; coercive force; composite material interfaces; exchange interactions (electron); grain size; interface magnetism; iron; iron alloys; magnetic anisotropy; magnetic thin films; molybdenum; platinum alloys; remanence; silicon compounds; sputter deposition; Mo-PtFe-Fe-Si3N4; RF magnetron sputtering; coercivity; composite films; exchange coupling; fine grain size; interface diffusion; magnetic properties; magnetocrystalline anisotropy; microstructure; remanence; separation; silicon nitride buffer-spacer layer; Annealing; Buffer layers; Coercive force; Grain size; Iron; Magnetic properties; Magnetic recording; Buffer/spacer layer; FePt; exchange-coupling; recording media;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2013.2243114
Filename
6559220
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