• DocumentCode
    415410
  • Title

    Characterization of Pd-H2 thin films irradiated by UV laser

  • Author

    Doria, D. ; Filippo, E. ; Di Giulio, M. ; Lorusso, A. ; Manno, D. ; Nassisi, V. ; Pedone, A.

  • Author_Institution
    Dept. of Phys., Lecce Univ., Italy
  • fYear
    2003
  • fDate
    22-27 June 2003
  • Firstpage
    590
  • Abstract
    We present the performance of Pd films with hydrogen and processed by an excimer laser. The laser fluence was lower than 25 mJ/cm2 and the initial hydrogen pressure was 5 bar. SEM and EDX analysis showed morphological modifications and the presence of grains containing new elements.
  • Keywords
    X-ray chemical analysis; excimer lasers; hydrogen; laser beam effects; optical films; palladium; scanning electron microscopy; ultraviolet radiation effects; 5 bar; EDX analysis; Pd-H2; Pd-H2 thin film; SEM; UV laser irradiation; excimer laser; hydrogen pressure; Indium tin oxide; Transistors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lasers and Electro-Optics Europe, 2003. CLEO/Europe. 2003 Conference on
  • Print_ISBN
    0-7803-7734-6
  • Type

    conf

  • DOI
    10.1109/CLEOE.2003.1313652
  • Filename
    1313652