Title :
GaN electronics with high electron mobility transistors
Author :
Adesida, I. ; Kumar, V. ; Lee, J.-W. ; Kuliev, A. ; Schwindt, R. ; Lanford, W.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Univ., Urbana, IL, USA
Abstract :
The III-nitrides AlN, GaN, and InN alloys are expected to be basis of a strong development of a novel family of semiconductor devices, for optoelectronics as well as for electronics, GaN-based high electron mobility transistors (HEMTs) have shown superior power handling and operating temperatures at frequency ranges that are beyond the limits of devices fabricated from Si and other III-V materials. This paper presents the state-of-the-art GaN HEMT technology and describes the potentials for the future.
Keywords :
III-V semiconductors; gallium compounds; high electron mobility transistors; integrated optoelectronics; power HEMT; wide band gap semiconductors; GaN; GaN electronics; high electron mobility transistors; operating temperatures; optoelectronics; superior power handling; Consumer electronics; Distributed amplifiers; Frequency; Gallium nitride; HEMTs; Light emitting diodes; MODFETs; Optical materials; Power amplifiers; Semiconductor materials;
Conference_Titel :
Microelectronics, 2004. 24th International Conference on
Print_ISBN :
0-7803-8166-1
DOI :
10.1109/ICMEL.2004.1314564