DocumentCode :
41557
Title :
Modeling and Analysis of Harmonic Spurs in DLL-Based Frequency Synthesizers
Author :
Ojani, Amin ; Mesgarzadeh, Behzad ; Alvandpour, Atila
Author_Institution :
Dept. of Electr. Eng., Linkoping Univ., Linköping, Sweden
Volume :
61
Issue :
11
fYear :
2014
fDate :
Nov. 2014
Firstpage :
3075
Lastpage :
3084
Abstract :
Periodic jitter raises the harmonic spurs at frequency synthesizer output spectrum, down-converting the out-of-band interferers into the desired band and corrupting the wanted signal. This paper proposes a comprehensive behavioral model for spur characterization of edge-combining delay-locked loop (DLL)-based synthesizers, which includes the effects of delay mismatch, static phase error (SPE), and duty cycle distortion (DCD). Based on the proposed model and utilizing Fourier series representation of DLL output phases, an analytical model which formulates the synthesizer spur-to-carrier ratio (SCR) is developed. Moreover, from statistical analysis of the analytical derivations, a closed-form expression for SCR is obtained, from which a spur-aware synthesizer design flow is proposed. Employing this flow and without Monte Carlo (MC) method, one can determine the required stage-delay standard deviation (SD) of a DLL-based synthesizer, at which a certain spurious performance demanded by a target wireless standard is satisfied. A design example is presented which utilizes the proposed design flow to fulfill the SCR requirement of -45 dBc for WiMedia-UWB standard. Transistor-level MC simulation of the synthesizer SCR for a standard 65-nm CMOS implementation exhibits good compliance with analytical models and predictions.
Keywords :
CMOS integrated circuits; Fourier series; Monte Carlo methods; delay lock loops; frequency synthesizers; statistical analysis; CMOS; DLL; Fourier series; Monte Carlo method; WiMedia-UWB standard; closed-form expression; delay mismatch; delay-locked loop-based synthesizers; duty cycle distortion; frequency synthesizers; harmonic spurs; out-of-band interferers; periodic jitter; size 65 nm; spur-aware synthesizer design; static phase error; statistical analysis; synthesizer spur-to-carrier ratio; wireless standard; Analytical models; Delays; Frequency synthesizers; Harmonic analysis; Random variables; Synthesizers; Thyristors; DLL; Delay mismatch; duty cycle distortion; edge-combiner; frequency synthesizer; harmonic spur; periodic jitter; static phase error;
fLanguage :
English
Journal_Title :
Circuits and Systems I: Regular Papers, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-8328
Type :
jour
DOI :
10.1109/TCSI.2014.2321188
Filename :
6827236
Link To Document :
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