DocumentCode :
415844
Title :
Mechanical fatigue reliability of PBGA assemblies with lead-free solder and halogen-free PCBs
Author :
Jonnalagadda, Krishna ; Qi, Fangjuan ; Liu, Jim
Author_Institution :
Motorola Adv. Technol. Center, Schamburg, IL, USA
Volume :
2
fYear :
2004
fDate :
1-4 June 2004
Firstpage :
165
Abstract :
In order to comply with the environmental legislations in Europe (WEEE) and Japan and to capture the market share in ´green´ products, electronics manufacturers are beginning to introduce lead-free solder and halogen-free PCBs into their products. The change of materials impacts the entire manufacturing supply chain, from component and solders material suppliers to assembly equipment vendors. The industry has identified possible alternatives to the Sn/Pb solder alloy but the majority of US based companies, working with NEMI, are selecting SnAgCu alloys, with minor compositional variations. However, much work is still required in the area of component and assembly reliability, especially in mechanical fatigue and impact loading, where the failure drivers are independent of the coefficient of thermal expansion. In this paper, the mechanical bend fatigue reliability of Plastic Ball Grid Array (PBGA) assemblies is investigated. Reliability of traditional PBGA assemblies is compared to those built with environmentally friendly materials. Experimental data is presented for four different combinations of Tin-Lead & Lead-Free solders as well as FR4 & Halogen-Free laminate substrates - TL/FR4, LF/FR4, TL/HF and LF/HF. The fatigue life was correlated to the different failure modes. A transition in failure modes as a function of the applied load was observed. A 3-D parametric finite element model was developed to correlate the local PCB strains and solder joint plastic strains with the fatigue life of the assembly.
Keywords :
ball grid arrays; bending; circuit reliability; copper alloys; failure analysis; fatigue testing; finite element analysis; microassembling; plastic deformation; plastic packaging; printed circuits; silver alloys; solders; thermal expansion; tin alloys; PBGA assemblies; PCB strains; SnAgCu; SnAgCu alloys; SnPb solder alloy; assembly reliability; electronics manufacture; environmental legislations; fatigue life; finite element model; halogen free laminate substrates; halogen-free PCB; impact loading; lead-free solder; lead-free solder/FR4 substrates; lead-free solder/halogen free substrates; mechanical fatigue reliability; plastic ball grid array assemblies; solder joint plastic strains; solders material; thermal expansion coefficient; tin-lead solder/FR4 substrates; tin-lead solder/halogenfree substrates; Assembly; Capacitive sensors; Electronic equipment manufacture; Environmentally friendly manufacturing techniques; Europe; Fatigue; Hafnium; Lead; Legislation; Plastics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2004. ITHERM '04. The Ninth Intersociety Conference on
Print_ISBN :
0-7803-8357-5
Type :
conf
DOI :
10.1109/ITHERM.2004.1318276
Filename :
1318276
Link To Document :
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