DocumentCode :
415850
Title :
Study on influence of the design factors on the reliability of BGA solder joints
Author :
Yu, Qiang ; Jin, Jae-Chul ; Abe, Hirokazu ; Shiratori, Masaki
Author_Institution :
Dept. of Mech. Eng. & Mater. Sci., Yokohama Nat. Univ., Japan
Volume :
2
fYear :
2004
fDate :
1-4 June 2004
Firstpage :
343
Abstract :
In recent years, package downsizing has become one of biggest trends in packaging technologies because of miniaturization and the high integration of electronic devices. As a result, the reliability of fatigue life has been prioritized as an important concern, since the thermal expansion difference between a package and printed circuit board causes thermal fatigue. But, the reliability of thermal fatigue life may be lowered by the dispersion of design factors such as the dimensions, shapes, and material properties of package systems. Also, the fracture modes (fatigue breakdown, frail destruction in the interface, and compound destruction, and so on) will be affected by these dispersion factors. Although this dispersion should be reduced in order to improve the reliability, reducing all dispersion is inefficient and time-consuming. So, the factors that greatly contribute to thermal fatigue life have to be reduced. In this study, evaluations of the influence of various design factors on the reliability of soldered joints of a Ball Grid Array (BGA) were carried out, and got each influence. With the results, design engineers can rate each factor´s effect on reliability and assess the reliability of their design beginning at the concept design stage. Consequently, it will be possible to avoid almost all reliability problems from the beginning. Also, by rating the factors, the design period can be shortened.
Keywords :
ball grid arrays; bending strength; chip scale packaging; fatigue testing; finite element analysis; fracture; integrated circuit design; integrated circuit reliability; printed circuits; solders; thermal expansion; BGA solder joint reliability; ball grid array; design factor; dispersion factor; electronic device integration; fatigue breakdown; fatigue life; fracture mode; frail interface destruction; miniaturization; packaging technology; printed circuit board; thermal expansion; thermal fatigue; Electronic packaging thermal management; Fatigue; Integrated circuit reliability; Material properties; Materials reliability; Printed circuits; Shape; Soldering; Thermal expansion; Thermal factors;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Thermal and Thermomechanical Phenomena in Electronic Systems, 2004. ITHERM '04. The Ninth Intersociety Conference on
Print_ISBN :
0-7803-8357-5
Type :
conf
DOI :
10.1109/ITHERM.2004.1318303
Filename :
1318303
Link To Document :
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