• DocumentCode
    415870
  • Title

    Thermal phenomena in nanoscale transistors

  • Author

    Goodson, K.E.

  • Author_Institution
    Stanford University
  • Volume
    1
  • fYear
    2004
  • fDate
    1-4 June 2004
  • Abstract
    Heat transfer within the microprocessor chip influences circuit performance and reliability, and on-chip thermal engineering will grow more important with future nodes on the technology roadmap. Near-term problems include nanometer-scale hotspots within individual transistors, millimeter-scale hotspots distributed on the microprocessor surface, and increasing temperatures in multilevel interconnects. Long-term challenges include the large thermal resistances of exotic nanotransistors (ultra-thin SOI, strained silicon, FINFETRillarFET) and 3D multilayer circuit architectures. This talk will summarize on-chip thermal challenges and research ranging from electron-phonon based nanotransistor simulations to microchannel cooling of 3D circuits with solid-state electroosmotic pumping.
  • Keywords
    Cooling; Heat engines; Heat transfer; Integrated circuit interconnections; Integrated circuit technology; Mechanical engineering; Microchannel; Microprocessor chips; Reliability engineering; Silicon;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems, 2004. ITHERM '04. The Ninth Intersociety Conference on
  • Conference_Location
    Las Vegas, NV, USA
  • Print_ISBN
    0-7803-8357-5
  • Type

    conf

  • DOI
    10.1109/ITHERM.2004.1319140
  • Filename
    1319140