DocumentCode
415870
Title
Thermal phenomena in nanoscale transistors
Author
Goodson, K.E.
Author_Institution
Stanford University
Volume
1
fYear
2004
fDate
1-4 June 2004
Abstract
Heat transfer within the microprocessor chip influences circuit performance and reliability, and on-chip thermal engineering will grow more important with future nodes on the technology roadmap. Near-term problems include nanometer-scale hotspots within individual transistors, millimeter-scale hotspots distributed on the microprocessor surface, and increasing temperatures in multilevel interconnects. Long-term challenges include the large thermal resistances of exotic nanotransistors (ultra-thin SOI, strained silicon, FINFETRillarFET) and 3D multilayer circuit architectures. This talk will summarize on-chip thermal challenges and research ranging from electron-phonon based nanotransistor simulations to microchannel cooling of 3D circuits with solid-state electroosmotic pumping.
Keywords
Cooling; Heat engines; Heat transfer; Integrated circuit interconnections; Integrated circuit technology; Mechanical engineering; Microchannel; Microprocessor chips; Reliability engineering; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems, 2004. ITHERM '04. The Ninth Intersociety Conference on
Conference_Location
Las Vegas, NV, USA
Print_ISBN
0-7803-8357-5
Type
conf
DOI
10.1109/ITHERM.2004.1319140
Filename
1319140
Link To Document