• DocumentCode
    415932
  • Title

    Thermal evaluation of DC/DC and PFC integrated power electronics modules

  • Author

    Pang, Ying-Feng ; Scott, Elaine P.

  • Author_Institution
    Dept. of Mech. Eng., Virginia Polytech. Inst. & State Univ., Blacksburg, VA, USA
  • fYear
    2004
  • fDate
    1-4 June 2004
  • Firstpage
    700
  • Abstract
    This paper presents the thermal evaluations of a direct current/direct current (DC/DC) integrated power electronics module (IPEM) and a power factor correction (PFC) IPEM employing the embedded power technology. Experimental and numerical approaches were used to characterize both IPEMs under forced air convection conditions. Finally, the significance of the planar metallization layer to the heat flow within the IPEM was investigated.
  • Keywords
    convection; integrated circuit metallisation; integrated circuit modelling; integrated circuit packaging; integrated circuit testing; power MOSFET; power factor correction; power integrated circuits; thermal analysis; DC-DC integrated power electronics modules; direct current-direct current integrated power electronics module; embedded power technology; forced air convection; heat flow; numerical analysis; planar metallization layer; power factor correction; thermal evaluation; Ceramics; Electronic packaging thermal management; Electronics packaging; MOSFET circuits; Metallization; Plastic packaging; Power electronics; Power system modeling; Silicon carbide; Thermal conductivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems, 2004. ITHERM '04. The Ninth Intersociety Conference on
  • Print_ISBN
    0-7803-8357-5
  • Type

    conf

  • DOI
    10.1109/ITHERM.2004.1319244
  • Filename
    1319244