DocumentCode
415950
Title
Micromechanical characterisation of Sn-Ag-Cu solder FCOB interconnects at ambient and elevated temperatures
Author
Li, Dezhi ; Liu, Changqing ; Conway, Paul
Author_Institution
Wolfson Sch. of Mech. & Manuf. Eng., Loughborough Univ., UK
Volume
1
fYear
2004
fDate
1-4 June 2004
Firstpage
128
Abstract
This paper characterises the micromechanical properties of lead free solder joints formed from fine pitch flip chip interconnection. Nanoindentation, which is suitable for the ultra-fine and complex microstructure in small volume materials, was used to test the micromechanical properties of solder joints, including hardness, elastic modulus and creep properties, at both ambient and elevated temperatures. A hot-stage, which allows test specimens heated up to 500°C, is used for the in-situ micromechanical study at elevated temperatures. Finally, the micromechanical properties obtained from nanoindentation were correlated with the microstructure and intermetallics identified by SEM.
Keywords
copper alloys; creep; crystal microstructure; elastic moduli; fine-pitch technology; flip-chip devices; hardness; indentation; integrated circuit interconnections; scanning electron microscopy; silver alloys; solders; tin alloys; 500 degC; SEM; SnAgCu; creep properties; elastic modulus; elevated temperature testing; fine pitch flip chip interconnection; hardness; intermetallics; lead free solder joints; microstructure; nanoindentation; solder FCOB interconnects; solder joint micromechanical characterisation; Creep; Environmentally friendly manufacturing techniques; Flip chip; Joining materials; Lead; Materials testing; Micromechanical devices; Microstructure; Soldering; Temperature;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN
0-7803-8365-6
Type
conf
DOI
10.1109/ECTC.2004.1319325
Filename
1319325
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