DocumentCode :
415950
Title :
Micromechanical characterisation of Sn-Ag-Cu solder FCOB interconnects at ambient and elevated temperatures
Author :
Li, Dezhi ; Liu, Changqing ; Conway, Paul
Author_Institution :
Wolfson Sch. of Mech. & Manuf. Eng., Loughborough Univ., UK
Volume :
1
fYear :
2004
fDate :
1-4 June 2004
Firstpage :
128
Abstract :
This paper characterises the micromechanical properties of lead free solder joints formed from fine pitch flip chip interconnection. Nanoindentation, which is suitable for the ultra-fine and complex microstructure in small volume materials, was used to test the micromechanical properties of solder joints, including hardness, elastic modulus and creep properties, at both ambient and elevated temperatures. A hot-stage, which allows test specimens heated up to 500°C, is used for the in-situ micromechanical study at elevated temperatures. Finally, the micromechanical properties obtained from nanoindentation were correlated with the microstructure and intermetallics identified by SEM.
Keywords :
copper alloys; creep; crystal microstructure; elastic moduli; fine-pitch technology; flip-chip devices; hardness; indentation; integrated circuit interconnections; scanning electron microscopy; silver alloys; solders; tin alloys; 500 degC; SEM; SnAgCu; creep properties; elastic modulus; elevated temperature testing; fine pitch flip chip interconnection; hardness; intermetallics; lead free solder joints; microstructure; nanoindentation; solder FCOB interconnects; solder joint micromechanical characterisation; Creep; Environmentally friendly manufacturing techniques; Flip chip; Joining materials; Lead; Materials testing; Micromechanical devices; Microstructure; Soldering; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN :
0-7803-8365-6
Type :
conf
DOI :
10.1109/ECTC.2004.1319325
Filename :
1319325
Link To Document :
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