• DocumentCode
    415982
  • Title

    Manufacturability and reliability of fine pitch wirebonding

  • Author

    Aoki, Toyohiro ; Sauter, Wolfgang ; Hisada, Takashi

  • Author_Institution
    IBM Japan, Ltd., Shiga, Japan
  • Volume
    1
  • fYear
    2004
  • fDate
    1-4 June 2004
  • Firstpage
    372
  • Abstract
    Fine pitch wirebonding is driven by the need to make smaller die with a higher I/O count. The difficulty of deciding whether or not a fine pitch wirebond process can be considered manufacturable is addressed in this paper. An equation to measure this ´manufacturability´ is mathematically derived and employed. Experiments are performed to evaluate other effects that challenge fine pitch wirebonding.
  • Keywords
    fine-pitch technology; integrated circuit interconnections; integrated circuit reliability; lead bonding; fine pitch wirebonding; high I/O count small die; interconnection quality; wirebonding manufacturability measurement equation; wirebonding reliability; Bonding; Equations; Intermetallic; Manufacturing processes; Performance evaluation; Probes; Pulp manufacturing; Surface contamination; Very large scale integration; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2004. Proceedings. 54th
  • Print_ISBN
    0-7803-8365-6
  • Type

    conf

  • DOI
    10.1109/ECTC.2004.1319367
  • Filename
    1319367