DocumentCode :
416074
Title :
Improvement of the adhesion of new memory packages by surface engineering
Author :
Herzog, Th. ; Köhler, M. ; Wolter, K.-J.
Author_Institution :
Electron. Packaging Lab., Technische Univ. Dresden, Germany
Volume :
1
fYear :
2004
fDate :
1-4 June 2004
Firstpage :
1136
Abstract :
For the assembly of new memory modules for the PC market, investigations were carried out concerning lead free solder contacts for the BGAs and new green plastics, which cause an improvement of the adhesion during the packaging process. Since there were frequent delaminations in the packaging process with these new memory chip materials during the mold processes, solder ball attach or the SMT reflow soldering, a special plasma pre-treatment was introduced. With this plasma pre-treatment, a significant improvement of the surface energies of the involved silicon chip, BT interposer material and solder mask was obtained and thus a better adhesion of the mold compound was achieved. For proof, measurement of the contact angle and computation of the surface energy on the surfaces treated in the plasma showed this improvement, in comparison to untreated samples.
Keywords :
adhesion; ball grid arrays; delamination; modules; moulding; plasma materials processing; plastic packaging; reflow soldering; semiconductor storage; surface energy; surface mount technology; BGA; BT interposer material; SMT reflow soldering; adhesion; contact angle; delaminations; green plastics; lead free solder contacts; memory modules; memory packages; mold compound; mold processes; packaging process; plasma pre-treatment; solder ball attach; solder mask; surface energy; surface engineering; Adhesives; Assembly; Environmentally friendly manufacturing techniques; Lead; Packaging; Plasma applications; Plasma materials processing; Plasma measurements; Surface engineering; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2004. Proceedings. 54th
Print_ISBN :
0-7803-8365-6
Type :
conf
DOI :
10.1109/ECTC.2004.1319484
Filename :
1319484
Link To Document :
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