DocumentCode :
416236
Title :
Reliability-driven layout decompaction for electromigration failure avoidance in complex mixed-signal IC designs
Author :
Jerke, Goran ; Lienig, Jens ; Scheible, Jurgen
Author_Institution :
Robert Bosch GmbH, Germany
fYear :
2004
fDate :
7-11 July 2004
Firstpage :
181
Lastpage :
184
Keywords :
Algorithm design and analysis; Automotive electronics; Conducting materials; Current density; Electromigration; Integrated circuit interconnections; Integrated circuit layout; Integrated circuit reliability; Routing; Signal design;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
ISSN :
0738-100X
Print_ISBN :
1-51183-828-8
Type :
conf
Filename :
1322466
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=416236
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