Title :
Accurate pre-layout estimation of standard cell characteristics
Author :
Yoshida, Hiroaki ; De, Kaushik ; Boppana, Vamsi
Author_Institution :
Zenasis Technologies, Inc. Campbell, CA
Keywords :
Algorithm design and analysis; Circuit simulation; Design methodology; Design optimization; Hardware; Integrated circuit measurements; Libraries; Manufacturing; Permission; Timing;
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
Print_ISBN :
1-51183-828-8