Title :
Selective gate-length biasing for cost-effective runtime leakage control
Author :
Gupta, Puneet ; Kahng, Andrew B. ; Sharma, Puneet ; Sylvester, Dennis
Author_Institution :
University of California at San Diego
Keywords :
Algorithm design and analysis; Circuits; Costs; Delay effects; Doping; Lithography; Permission; Process design; Pulp manufacturing; Runtime;
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
Print_ISBN :
1-51183-828-8
