DocumentCode
416283
Title
Parametric yield estimation considering leakage variability
Author
Rajeev R.Rao ; Devgan, Anirudh ; Blaauw, David ; Sylvester, Dennis
Author_Institution
University of Michigan, Ann Arbor, MI
fYear
2004
fDate
7-11 July 2004
Firstpage
442
Lastpage
447
Keywords
Delay; Frequency; Integrated circuit reliability; Integrated circuit yield; Leakage current; Performance analysis; Process design; Subthreshold current; Threshold voltage; Yield estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location
San Diego, CA, USA
ISSN
0738-100X
Print_ISBN
1-51183-828-8
Type
conf
Filename
1322522
Link To Document