Title :
Efficient on-line testing of FPGAs with provable diagnosabilities
Author :
Verma, Vinay ; Dutt, Shantanu ; Suthar, Vishal
Author_Institution :
Xilinx Inc., San Jose, CA
Keywords :
Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Field programmable gate arrays; Integrated circuit reliability; Integrated circuit testing; Logic testing; Programmable logic arrays; System testing;
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
Print_ISBN :
1-51183-828-8