DocumentCode :
416294
Title :
On test generation for transition faults with minimized peak power dissipation
Author :
Li, Wei ; Reddy, Sudhakar M. ; Pomeranz, Irith
Author_Institution :
Univ. of Iowa, USA
fYear :
2004
fDate :
7-11 July 2004
Firstpage :
504
Lastpage :
509
Keywords :
Circuit faults; Circuit testing; Cities and towns; Clocks; Fault detection; Flip-flops; Permission; Power dissipation; Power generation; Propagation delay;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
ISSN :
0738-100X
Print_ISBN :
1-51183-828-8
Type :
conf
Filename :
1322533
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=416294
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