Title :
Automatic generation of breakpoint hardware for silicon debug
Author :
Vermeulen, Bart ; Urfianto, Mohammad Z. ; Goel, Sandeep K.
Author_Institution :
Philips Research Laboratories, The Netherlands
Keywords :
Clocks; Event detection; Hardware; Laboratories; Observability; Performance analysis; Permission; Prototypes; Silicon; Software tools;
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
Print_ISBN :
1-51183-828-8
