DocumentCode

416311

Title

Defect tolerant probabilistic design paradigm for nanotechnologies

Author

Jacorne, M. ; He, Chen ; De Veciana, Gustavo ; Bijansky, Stephen

Author_Institution

The University of Texas at Austin

fYear

2004

fDate

7-11 July 2004

Firstpage

596

Lastpage

601

Keywords

Computer aided manufacturing; Costs; Design methodology; Helium; Nanoelectronics; Nanoscale devices; Scalability; Self-assembly; Silicon; Uncertainty;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference, 2004. Proceedings. 41st

Conference_Location

San Diego, CA, USA

ISSN

0738-100X

Print_ISBN

1-51183-828-8

Type

conf

Filename

1322552