Title :
Worst-case circuit delay taking into account power supply variations
Author :
Kouroussis, Dionysios ; Ahmadi, Rubil ; Najm, Farid N.
Author_Institution :
University of Toronto, Canada
Keywords :
Algorithm design and analysis; Analytical models; Circuit simulation; Circuit testing; Delay; Power grids; Power supplies; RLC circuits; Timing; Voltage fluctuations;
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
Print_ISBN :
1-51183-828-8