• DocumentCode
    416362
  • Title

    Noise characterization of static CMOS gates

  • Author

    Kanj, Rouwaida ; Lehner, Timothy ; Agrawal, Bhavna ; Rosenbaum, Elyse

  • Author_Institution
    University of Illinois at Urbana-Champaign
  • fYear
    2004
  • fDate
    7-11 July 2004
  • Firstpage
    888
  • Lastpage
    893
  • Keywords
    Abstracts; Analytical models; Circuit noise; Circuit simulation; Coupling circuits; Integrated circuit modeling; Integrated circuit noise; Mathematical model; Multi-stage noise shaping; Noise generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Design Automation Conference, 2004. Proceedings. 41st
  • Conference_Location
    San Diego, CA, USA
  • ISSN
    0738-100X
  • Print_ISBN
    1-51183-828-8
  • Type

    conf

  • Filename
    1322609
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=416362