DocumentCode :
416362
Title :
Noise characterization of static CMOS gates
Author :
Kanj, Rouwaida ; Lehner, Timothy ; Agrawal, Bhavna ; Rosenbaum, Elyse
Author_Institution :
University of Illinois at Urbana-Champaign
fYear :
2004
fDate :
7-11 July 2004
Firstpage :
888
Lastpage :
893
Keywords :
Abstracts; Analytical models; Circuit noise; Circuit simulation; Coupling circuits; Integrated circuit modeling; Integrated circuit noise; Mathematical model; Multi-stage noise shaping; Noise generators;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
ISSN :
0738-100X
Print_ISBN :
1-51183-828-8
Type :
conf
Filename :
1322609
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=416362
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