DocumentCode

416363

Title

A scalable soft spot analysis methodology for compound noise effects in nano-meter circuits

Author

Zhao, Chong ; Bai, Xiaoliang ; Dey, Sujit

Author_Institution

Univ. of California, San Diego, La Jolla, CA

fYear

2004

fDate

7-11 July 2004

Firstpage

894

Lastpage

899

Keywords

Analytical models; Circuit noise; Crosstalk; Guidelines; Noise reduction; Protection; Scalability; Single event transient; System-on-a-chip; Transient analysis;

fLanguage

English

Publisher

ieee

Conference_Titel

Design Automation Conference, 2004. Proceedings. 41st

Conference_Location

San Diego, CA, USA

ISSN

0738-100X

Print_ISBN

1-51183-828-8

Type

conf

Filename

1322610