Title :
On the generation of scan-based test sets with reachable states for testing under functional operation conditions
Author_Institution :
Purdue University, W. Lafayette, IN
Keywords :
Circuit faults; Circuit testing; Delay; Design for testability; Electrical fault detection; Fault detection; Logic testing; Sequential analysis; Sequential circuits; Synchronous generators;
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
Print_ISBN :
1-51183-828-8
