Title :
Scan-BIST based on transition probabilities
Author_Institution :
Purdue University, W. Lafayette, IN
Keywords :
Automatic testing; Benchmark testing; Built-in self-test; Circuit faults; Circuit testing; Electrical fault detection; Fault detection; Fault tolerance; Flip-flops; Logic testing;
Conference_Titel :
Design Automation Conference, 2004. Proceedings. 41st
Conference_Location :
San Diego, CA, USA
Print_ISBN :
1-51183-828-8
