DocumentCode
416455
Title
Measurement of coating thickness non-uniformity of photosensitive film in production process
Author
Inoue, Noritaka ; Aoshima, Nobuharu
Author_Institution
Mitsubishi Papermills Ltd., Ibaraki, Japan
Volume
1
fYear
2003
fDate
4-6 Aug. 2003
Firstpage
15
Abstract
In photo material industry, the check of quality about surface of photosensitive layer is very important. If there is uneven thickness failure in photo layer, it may cause a shadow or a stripe. In these days, a laser deposit analyzer is available that lights laser spot on material and measures reflection. It has reliability for detecting a pinhole or other sharp deposit like bull´s eye, but it is difficult to detect uneven thickness in photo layer. In this report, a method of analyzing uneven thickness like stripes on photo layer or other deposits is described. We tested many methods of photo surface inspection. Finally, we chose light reflection method and constructed a test system of photo layer surface inspection equipment that can be built in or added on to photo material factory machines. The constructed equipment proved to be less sensitive to mechanical noises and low cost of building and running.
Keywords
digital instrumentation; light reflection; optical films; thickness measurement; Hitachi H8/3048 control processor; coating thickness nonuniformity measurement; laser deposit analyzer; light reflection method; nondestructive measurement; photo layer surface inspection equipment; photo material industry; photosensitive film; photosensitive layer; production process;
fLanguage
English
Publisher
ieee
Conference_Titel
SICE 2003 Annual Conference
Conference_Location
Fukui, Japan
Print_ISBN
0-7803-8352-4
Type
conf
Filename
1323305
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